Reflection Electron Energy Loss Spectroscopy of Alkali Metals on Silicon
نویسندگان
چکیده
منابع مشابه
Surface microanalysis by reflection electron energy-loss spectroscopy.
Several basic physical concepts of applying eq. Ik = I sigma Nxt to surface microanalysis by reflection electron energy-loss spectroscopy (REELS) are clarified. Here Ik and I are the integrated intensities of the core ionization edge and the low loss part, sigma is the scattering cross section of element x with atomic concentration Nx, and t is the specimen thickness. The reflected inelastic el...
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Surface excitations, in addition to bulk excitation, undergone by signal electrons in surface electron spectroscopies, such as Auger electron spectroscopy, and X-ray photoelectron spectroscopy, play an important role in the formation of electron spectra. Those inelastic scattering processes not only induce decay in the peak intensity, but also form background appearing in the lower kinetic ener...
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Electron energy-loss spectroscopy (EELS) is an analytical technique that is based on inelastic scattering of fast electrons in a thin specimen. In a transmission electron microscope (TEM) it can provide structural and chemical information about a specimen, even down to atomic resolution. This review provides an overview of the physical basis and new developments and applications of EELS in scan...
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ژورنال
عنوان ژورنال: Acta Physica Polonica A
سال: 1992
ISSN: 0587-4246,1898-794X
DOI: 10.12693/aphyspola.81.47